Ing. Buero s.r.o. - Dynamic HTRB Systems

This dynamic HTRB system is designed for testing of ruggedness of devices to withstand puls voltages with high du/dt and has following parameters :

	Test capacity:	4 x 80 DUTs
	Test chambers :	4
	Temperature range :	50°C to 200°C per chamber
	Test boards per chamber :	4
	Possible voltage range :	0V to 1500V
	Rise time :	max. 50ns to 1500V, possibility of lower du/dt
	Pulse frequency :	100Hz to 100kHz
	Duty cycle :	1% to 99%
	Operating system :	MS Windows XP
	Handling :	Comfortable graphic platform
	Alarms :	Programmable, light or sound
	System controls :	Continous for voltages and temperatures of chambers
	DUT controls :	Continous for bias voltages and leakage currents with alarm and disconnection of test board by values over programmable limits

Ing. Buero s.r.o., Lozická 129, 190 16 Újezd nad Lesy - Praha 9, Czech republic

tel./fax : +420 281 971 605