Our standard IOL
system is abble to test low power devices soldered on substrate as well as high power
devices. System can handle p-channel or n-channel MOS, IGBT and diodes and consist of two
parts.
CALIBRATING EQUIPMENT:
This calibrating equipment is necessary above all for low power
smd devices because the data sheet thermal resistance Rth is almost allways different of
actual Rth of DUT on test board
This equipment offers following features :
Test capacity :
80 DUTs
Operating systems :
MS Windows XP
Possible modes :
- calibration
- IOL test by
high temperature, f.e. between 150°C and 200°C
Measurement :
- Thermal dependance of Vgs,
Rds(on) and Vr(diode)
- Actual thermal resistance Rth of all DUTs on test board
Handling :
Comfortable graphic platform
After calibration system offers calibrating
datas for IOL test and graphs of thermal dependance of different parameters, so that
operator can see, which parameter is the best for the measurement of junction temperature
Tj during the following IOL test
IOL TEST SYSTEM :
This equipment offers following features :
Test capacity :
3 lots with 80 DUTs per lot
Test condition :
constant power with accuracy of 1%
constant current with accuracy of 1%
Current range :
Autoranging 20mA to 2A or 20mA to 20A
Measurement :
Junction temperature of each DUT every 50ms
Load current and voltage of each DUT every 50ms
Case temperature measurement over PT100
Power supplies :
Programmable 15V/200A for each lot
Operating system :
MS Windows XP
Handling :
Comfortable graphic platform
Ing. Buero s.r.o.,
Lozická 129, 190 16 Újezd nad Lesy - Praha 9, Czech republic
IOL SYSTEMS - operating life test 
