This test system
fulfil requirements on HTRB systems for high voltage IGBT devices with high reverse power
losses. This system is only HTRB equipment with continuous measurement of junction
temperature under bias voltage up to 2000V.
Test capacity:
4 x 80 DUTs
Test chambers :
4
Temperature range :
50°C to 200°C per chamber
Test boards per chamber :
4
Possible voltage range :
0V to 1600V
0V to 2000V
Power supplies :
Separate power supply for each test board
Calibration :
Auto-calibration of each DUT before test
Test mode :
Regulation of test temperatur after Tjunction
Regulation of test temperatur after Tcase
Sockets :
Reliable device sockets designed for 200°C
Operating system :
MS Windows XP
Handling :
Comfortable graphic platform
Alarms :
Programmable, light or sound
System controls :
Continous for voltages and temperatures of chambers and test
boards
DUT controls :
Continous for bias voltages, leakage currents and juction
temperatures with alarm and disconnection of test board by values over programmable limits
Ing. Buero s.r.o.,
Lozická 129, 190 16 Újezd nad Lesy - Praha 9, Czech republic
HTRB TEST SYSTEMS for high voltage IGBT devices 
